• Non-contact and compact PN type checker
• Principle: Photovoltaic effect
• No damage and no stain by Non-contact method
• Possible to check even oxidized film on water surface
• Instantly P/N discrimination
• Checking range:
  (Resistivity)
  0.1 Ohm-cm to 1000 Ohm-cm
  (Depends on surface conditions)
  (Thickness)
  Up to approx. 3mm
• Available to build into an automatic wafer loading / unloading system (PN-80 alpha)

Silicon wafers
- Lapped
- Etched
- Polished
- Mirror
- Bulk

• Non-contact eddy current tester with easy manual operation
• Compact design
• Easy to set up measurement condition by JOG dial
• Choose one type of sensor from 4 sensors by measurement range
• Wafers size: 2 inch to 8 inch
• Measurement range:
  (Resistivity)
  Low: 0.001 Ohm-cm to 0.05 Ohm-cm
  Middle: 0.05 Ohm-cm to 0.5 Ohm-cm
  High: 0.5 Ohm-cm to 60 Ohm-cm
  S/High: 5 Ohm-cm to 100 Ohm-cm
  (Sheet resistance)
  Low: 0.01 Ohm/sq to 0.05 Ohm/sq
  Middle: 0.5 Ohm/sq to 10 Ohm/sq
  High: 10 Ohm/sq to 1000 Ohm/sq
  S/High: 50 Ohm/sq to 2000 Ohm/sq

Silicon wafers

Thin Films
- Metal
- ITO

Chemical compound
- GaAs Epi layers and so on

• Easy operation and data processing by PC
• Replacement sensors of Middle and High by measurement range
• Temperature correction function (for silicon wafers)
• Wafers size: 3 inch to 8 inch (There is a 2 inch and 12 inch version)
• Measurement range:
  (Resistivity)
  Low: 0.001 Ohm-cm to 0.05 Ohm-cm
  Middle: 0.05 Ohm-cm to 0.5 Ohm-cm
  High: 0.5 Ohm-cm to 60 Ohm-cm
  *Available up to approx. 100 Ohm-cm
  (Sheet resistance)
  approx. Up to 3000 Ohm/sq

• Simple measurement unit for resistivity checking and P&N type
• Resistivity: Eddy current (Non-contact) method
• Non-contact and compact PN type checker
• Principle: Photovoltaic effect
• No damage and no stain by Non-contact method
• Possible to check even oxidized film on wafer surface
• Wafer size: 2 inch and 12 inch
• Well suited for silicon wafers of solar cells and/or reclaimed wafers
• Resistivity sorting (For example): 0.5 to 1 to 10 Ohm-cm (Other sorting ranges are available)
• Easy operation by putting samples on the measurement stage

• Non-contact method
  Resistivity range 20mΩcm to 3000Ωcm
  Measurement time - 0.5s
• Pen will light up for either P or N type

Silicon wafers
- Lapped
- Etched
- Polished
- Mirror
- Bulk

Silicon Ingots
Silicon Remelt
Silicon Pot Scrap

• Simple measurement unit for resistivity checking and thickness measurement
• Resistivity: Eddy current (Non-contact) method
• Thickness: Gauge method
• Well suited for silicon wafers of solar cells and/or reclaimed wafers
• Resistivity sorting (For example): 0.5 to 1 to 10 Ohm-cm (Other sorting ranges are available)
• Easy operation by putting samples on the measurement stage
• Built in PN type checkers (Resistivity + PN) is available (RC-2PN)

• Silicon Wafers and Scrap Resistivity Gauge
• Contact method

• Contact PN type checker for low to high wide range resistivity
• Principle: Thermo-electromotive force method (Seebek effect)
• Electrode: Hot probe and Cold probe
• Possible to check most figure of sample (Silicon wafer, Bulk, Ingot and so on) (Oxidized film on wafer surface: Not available)
• Equipped with Thermometer and Analogue meter
• Checking range:
  (Resistivity) 1m Ohm-cm to 20 K Ohm-cm
• Available to build into an automatic wafer loading / unloading system (PN-12 beta)

Silicon Wafers
- Lapped
- Etched
- Polished
- Mirror
- Bulk

Silicon Ingots
Silicon Remelt
Silicon Pot Scrap

• 4-point contact for Resistivity
  - Computerized Accuracy with Smart Probe Technology
  - Selectable current sources: 2mils or 200 micro amps.
  - Reports Low Resistance condition.
  - Four Point Probe Head by Cascade.
  - Portable! Ultra Small!!
  - Ergonomic Probe handles (one for Type and one for Resistance)
  - LCD Displays actual resistance >0.10 ohm cm.
  - LCD Displays Type N/P with Distinct Sound reporting.
  - Auto mode checks Resistance and Type in 1 second.

Silicon Wafers
- Lapped
- Etched
- Polished
- Mirror
- Bulk

Silicon Ingots
Silicon Remelt
Silicon Pot Scrap