NC-80M
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- Sheet resistance multi-point measurement system for thin metal layers
- Calibration function
- Layer thickness direct read out with software
- Min. 5mm position from edge can be measured
- Wafer size: 3 inch to 8 inch
- Meas. range:
(Sheet resistance)
5m Ohm/sq to 1 Ohm/sq
Up to 20 Ohm/sq (Option)
- Mapping software: Up to 121 points (Option)
- Compatible fully (handling) automatic carrier system (Option)
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Metal layers
- Ai, Cu, Ti, TiN
and so on |