• Non-contact and compact PN type checker
• Principle: Photovoltaic effect
• No damage and no stain by Non-contact method
• Possible to check even oxidized film on water surface
• Instantly P/N discrimination
• Checking range:
  (Resistivity)
  0.1 Ohm-cm to 1000 Ohm-cm
  (Depends on surface conditions)
  (Thickness)
  Up to approx. 3mm
• Available to build into an automatic wafer loading / unloading system (PN-80 alpha)

Silicon wafers
- Lapped
- Etched
- Polished
- Mirror
- Bulk

• Contact PN type checker for low to high wide range resistivity
• Principle: Thermo-electromotive force method (seebek effect)
• Electrode: Hot probe and Cold probe
• Possible to check most figure of sample (Silicon wafer, Bulk, Ingot and so on) (Oxidized film on wafer surface: Not available)
• Equipped with Thermometer and Analogue meter
• Checking range:
  (Resistivity) 1m Ohm-cm to 20 K Ohm-cm
• Available to build into an automatic wafer loading / unloading system (PN-12 beta)

Silicon wafers
- Lapped
- Etched
- Polished
- Mirror
- Bulk

Silicon ingots